Overview
If a new product fails in an electromagnetic interference (EMI) pre-compliance test or a standard compatibility test, troubleshooting and improvement is a priority. Near-field probes and spectrum analyzers look for interference sources and verify that improvements are the most common method.
Figure 1 Agilent X Series Signal Analyzer and N9311X-100 Near Field Probe
Summary of near field testing
In the certification body, radiation leak tests are performed using various types of calibrated antennas, all of which are far field measurements. The standard far-field radiation leak test can accurately tell us whether the tested parts meet the corresponding EMI standards. But the far-field test can't tell the engineer whether the serious radiation problem comes from the gap in the housing, from the connected cable, or a communication interface such as USB or LAN. In this case, we can locate the true source of radiation by means of near-field testing.
The problem with near-field EMI measurements is that the results of measurements using near-field probes and the use of antennas for far-field measurements are not directly mathematically convertible. But there is a basic principle: the greater the radiation in the near field, the greater the radiation in the far field. So using a near-field probe measurement is actually a relative quantity measurement, not an exact absolute quantity measurement. When using near-field probes for EMI pre-compliance testing, we often compare the results of new DUT tests with the results of a near-field probe test (near-field test) of a known qualified DUT to predict EMI radiation leak testing (far The results of the field test) are not directly compared to the EMI-compliant limit line. At the same time, the absolute value of the test is not significant, because the test results and many variables, including the position of the probe, the shape of the device under test, etc. will be closely related.
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