Photoluminescent Image System Solution for Crystalline Silicon Solar Cells Crystalline silicon solar cells currently consist mainly of monocrystalline and polycrystalline silicon cells. They are characterized by stable performance and mature market technology. Conventional cell sizes are 125mm or 156mm square cells. . During the development of crystalline silicon solar cells, many serious problems have emerged, such as fragmentation, cell cracking, surface contamination, and poor electrodes. These defects limit the photoelectric conversion efficiency and service life of the battery. At the same time, due to the lack of perfect industry standards, the quality of crystalline silicon solar cells is also uneven, and the presence of some defect films directly affects the stability of the components and even the photovoltaic system. Therefore, crystalline silicon solar cells need a fast, effective and accurate location and inspection method to check possible problems in the production process.
The Zhuoli Optical Helios photoluminescence imaging system can quickly measure the absolute minority carrier lifetime of crystalline silicon and simultaneously obtain two-dimensional images that characterize the defect distribution of the material. In the solar cell wafer production process, this information can be used for online screening and process monitoring of feeds to optimize each process. By measuring the corrected photoluminescence image, it is possible to quantitatively measure the defect distribution and impurity level of solar cell raw materials.
Wafer Feed Screening: Zhuoli Han Helios photoluminescence image test system tests the lifetime of each wafer at the feed end of the solar cell wafer production line to obtain the estimated photoelectric conversion efficiency of the produced cell wafer. According to the test data, the wafers are graded and the corresponding optimization process is selected according to different grades.
Production Process Control: The Zhuoli Optical Helios photoluminescence imaging test system is a system that is set up as an off-line inspection mode and monitors key processes on the production line. By comparing the difference between the measurement data of the cell before and after the process, the process parameters of the production line can be optimized. For new production lines, process parameters need to be debugged before being put into operation. With the photoluminescence image test system, the commissioning time can be greatly shortened and production can be quickly started.
Damage inspection and detection: Zhuoli Hanguang Helios photoluminescence image testing system can detect the damage and cracking of the battery during the production process.The crystalline silicon solar cell manufacturer can achieve the goal of maximizing the efficiency of the product's battery with the lowest production cost by using the Zhuoli Han Helios photoluminescence image testing system.
For details, please visit Beijing Zhuo Li Hanguang Instrument Co., Ltd. website: http://